Thin Film Evolution Equation for a Strained Anisotropic Solid Film on a Deformable Isotropic Substrate

Authors: Wondimu Tekalign, Agegnehu Atena

ABSTRACT
We consider a continuum model for the evolution of an epitaxially-strained dislocation-free anisotropic thin solid film on isotropic deformable substrate in the absence of vapor deposition. By using a thin film approximation we derived a nonlinear evolution equation. We examined the nonlinear evolution equation and found that there is a critical film thickness below which every film thickness is stable and a critical wave number above which every film thickness is stable.

Source:

Journal: Journal of Applied Mathematics and Physics
DOI: 10.4236/jamp.2018.64074 (PDF)
Paper Id: 84023

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