Authors: Wondimu Tekalign, Agegnehu Atena
We consider a continuum model for the evolution of an epitaxially-strained dislocation-free anisotropic thin solid film on isotropic deformable substrate in the absence of vapor deposition. By using a thin film approximation we derived a nonlinear evolution equation. We examined the nonlinear evolution equation and found that there is a critical film thickness below which every film thickness is stable and a critical wave number above which every film thickness is stable.
Paper Id: 84023 (metadata)
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